Large-aperture beam profiler [200 mm / For visible light / near-infrared]
LBP-B200WB-G
The LBP-B200WB-G is a beam profiler based on the large-aperture LBP-B200VIS-U, the standard model in the series, further enabling beam measurement and analysis across a broad wavelength range from visible light to near-infrared. It supports measurement wavelengths from 400 nm to 1700 nm, a beam area of 200 mm × 200 mm, and lasers with power densities up to 100 W/cm².
Features
- Light receiving surface dimensions: 200 mm × 200 mm
- Optical resolution: approx. 600 μm
- Measurement wavelength range: 400 nm – 1700 nm
- Laser measurement up to high output is possible (0.1 W/cm2 to 100 W/cm2).
- With a function to reduce speckle (sparkling light and dark spots)
- Beam profiler analysis app(LaseView )included
specification
| Optical resolution | Around 600μm |
|---|---|
| Frame rate | 60 fps（at maximum） |
| Measurement wavelength range | 950～1700nm(Adjusted at specified wavelength) |
| Exposure time | 6 μs～10 s |
| Interface | Gigabit Ethernet(1000BASE-T) |
| Power supply | 12 V, 7 W(supplied by attached AC adaptor) |
| Motor supply | 6 V, 100 mA or less(supplied by attached AC adaptor) |
| Remark |
|
| Price | contact us |
| Lead time | contact us |
※１ According to product specification, resolution is available on whole area of light-receiving surface,Inspection prior to shipment will be made only on the center of light-receiving surface.
Diagram
LaseView-LHB-200-VISNIR-GigE External view
