Large-aperture beam profiler [100 mm / For visible light/near infrared] LBP-B100WB-G

Large-aperture beam profiler [100 mm / For visible light/near infrared]
LBP-B100WB-G

The LBP-B100WB-G is a beam profiler based on the large-aperture LBP-B100VIS-U, a standard model in the series, further enabling beam measurement and analysis across a broad wavelength range from visible light to near-infrared. It supports measurement wavelengths from 400 nm to 1700 nm, beam sizes up to 100 mm × 100 mm, and lasers with power densities up to 100 W/cm².

Features

Light receiving surface dimensions: 100 mm × 100 mm
Optical resolution: approx. 300 μm
Measurement wavelength range: 400 nm – 1700 nm
Laser measurement up to high output is possible (0.1 W/cm2 to 100 W/cm2).
With a function to reduce speckle (sparkling light and dark spots)
Beam profiler analysis app(LaseView )included

specification

Light receiving surface size	100mm × 100mm
Optical resolution	Around 300 μm（※1）
Measurement wavelength range	400～1700nm（Focus is made with 1310 nm）
Power supply	Undecided(Supplied from the included AC adapter)
Size(mm)	W215 × H137 × D219(Excluding stand, cable and AC adapter)
Weight	2.5 kg or less(Excluding stand, cable and AC adapter)
Software	Comply with LaseView
Remark	Please use a CAT5E or CAT6 compatible LAN cable. (LAN cable is not included.) In case of using small beam diameter, sufficient resolution is not available.Please make beam diameter 10 mm and over on your use. Frame rate decrease depending on the PC’s Computing ability or USB terminal. In case of using speckle reduction function, 10 – 20 image averaging process is required and 1 – 2 second (typical) measurement time is needed.
Price	contact us
Lead time	contact us

※ 1 Typically, the resolution as specified is obtained over the entire light-receiving surface. However, the inspection before shipment is limited to the center.