What is Beam profiler?
A beam profiler is an instrument that measures the beam diameter and spatial intensity distribution of a laser. The beam diameter and spatial intensity distribution are laser characteristics that describe how the beam will behave.
For example, even if a laser has the same intensity and beam diameter, if the spatial intensity distribution is different, the focusing characteristics will change, and the same behavior will not be obtained. In addition, even if the laser cavity is rigorously designed, it is affected by manufacturing errors in the optical elements and the surrounding environment such as temperature.
Therefore, it is difficult to accurately predict the beam characteristics to be obtained.
For this reason, it is important to measure the actual beam characteristics in laser beam applications.
A beam profiler is used to measure the beam characteristics.
Features on Kokyo’s Beam profiler
- Software Subscription is available for US $100 / month, along with common CMOS and CCD cameras. (free 7-day trial)
- Beam diameter 2 μm 〜 200 mm measurable
- Wavelength 190 nm 〜 16 μm measurable
- Customization available on both software and hardware
Software
Commercially sold low-cost camera is available as beam profiler.
Multiple cameras can be connected to Single software.
Subscription available.
Camera set
Most suitable camera is selected for each condition, such as laser wavelength, beam diameter and pulse/CW.
Camera + optical system
Beam diameter (2 μm 〜 200 mm), wavelength (190 nm〜16 μm) and power (〜1 kW) are measurable.
Beam profiler, which can measure the largest beam in the world is also available.
Kokyo’s Beam profiler / Products series
Software
Beam profiler with M2 platform software “LaseView Subscription”
M2 measurement and beam divergence measurement function are available.
Free trial use (for 7 days) is possible.
Beam diameter is measurable from 2μm (Maximum measurable diameter:200 mm).
Beam pointing measurement is also possible.
Trial use:Free for 7 days
Price: USD 100 / month (excluding tax)
Camera set
Beam profiler Camera series “LaseView-CA”
Model: LaseView-CA
Price: From USD 1,341 (excluding tax and software)
Camera + optical system
Beam profiler for large diameter and high-power “LaseView-LHB”
both measurable.
In measuring process, attenuation optics are not required.
Direct laser irradiation leads to beam profile measurement.
Model: LaseView-LHB
Price: USD 12,980 (excluding tax and software)
Beam profiler for 600W fiber laser
Convenient to carry because it is completely air-cooled.
Measurement is possible by adjusting the height with the knob so that the beam is incident vertically from above and the beam waist is on the CCD.
Model: LaseView-600FL
Price: USD 19,030 (excluding tax and software)
LaseView with Screen Reduction Converter for LED measurement
This is available to measure the light with large spread angle like LED.
Model:LaseView-SRC-LED
Price: USD 550 (excluding tax and software)
Selection by wavelength and beam diameter in our beam profilers
Selection by wavelength and beam diameter |
wavelength | |||||
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190 – 400 nm | 400 – 1100 nm | 900 – 1700 nm (NIR) | 2 -16 μm (MIR) | |||
Beam diameter | 2 μm~ 100 μm 5 μm~ 100 μm (NIR) |
Micro beam diameter measurement optical system set + camera LaseView-CA-DUV-BE |
Micro beam diameter measurement optical system set + camera LaseView-CA50-NCG-BE |
Micro beam diameter measurement optical system set + camera LaseView-CA-SWIR-BE |
Custom correspondence | |
30 μm~ 5 mm 200 μm~ 5 mm (NIR) 90 μm~ 12 mm (MIR) |
Femtosecond pulse or condensed light |
Camera LaseView-CA50-NCG |
Camera LaseView-CA-SWIR |
Camera LaseView-CA-MIR |
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Parallel light | Custom correspondence | ー | ||||
5 mm ~ 10 mm | Beam profiler with UV converter LaseView-SRC-DUV *corresponding to 200 – 390 nm |
LaseView with Screen Reduction Converter for LED measurement LaseView-SRC-LED *corresponding to 400 – 800nm or 800 – 1000nm, Please indicate the wavelength you require. |
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1 mm ~ 50 mm 3 mm ~ 50 mm (NIR) |
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Beam profiler for large diameter and high-power LaseView-LHB-25 |
Beam profiler for large diameter and high-power(NIR) LaseView-LHB-NIR |
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Beam profiler for large diameter and high-power LaseView-LHB |
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– | Beam profiler for large diameter and high-power (High heat-resistant type, ~100 kW/cm2) LaseView-LHB-UHP |
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Beam profiler for large diameter and high-power (Wide wavelength) LaseView-LHB-VISNIR |
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1 mm ~ 100 mm 3 mm ~ 100 mm (NIR) |
ー | Beam profiler for large diameter and high-power LaseView-LHB-100 |
Beam profiler for large diameter and high-power(NIR) LaseView-LHB-100-NIR |
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ー | Beam profiler for large diameter and high-power (Wide wavelength) LaseView-LHB-100-VISNIR |
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1 mm ~ 200 mm |
ー | Beam profiler for large diameter and high-power LaseView-LHB-200 |
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Selection by wavelength and power in our beam profilers
Selection by wavelength and power |
wavelength | ||||
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190 – 400 nm | 400 – 1100 nm | 1060 – 1080 nm | 900 – 1700 nm (NIR) | ||
power | ー | Beam profiler with M2 platform software LaseView Subscription |
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< 100 mW | +ND filter set(NDFS-CA50) | ||||
< 1 W< 10 W | +Attenuating optics set with beam splitter | ||||
< 100 W | +Attenuation optics set with double beam splitter | ||||
< 10 W | ー |
Beam profiler for large diameter |
Beam profiler for large diameter and high-power(NIR) LaseView-LHB-NIR |
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Beam profiler for large diameter and high-power LaseView-LHB |
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< 600 W | ー | ー | Beam profiler for 600W fiber laser LaseView-600FL |
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< 1k W | ー | ー | Contact us | ー |
Comparison between Kokyo’s Beam profiler and conventional technology
Fixed beam profiler system with CCD camera is adopted on Kokyo’s products.
Here are advantages and disadvantages between scanning beam profiler system and fixed beam profiler’s one.
Advantage | Disadvantage | |
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Fixed beam profiler ・CCD camera type |
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※ Kokyo’s beam profiler is low-cost and can measure large beam diameter |
Scanning beam profiler ・Pinhole type ・Slit type ・Knife Edge type |
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Comparison between Kokyo’s Beam profiler and conventional Beam profiler
Commercially sold CCD camera or CMOS camera is available on Kokyo’s Beam profiler and so,
low-cost and practical beam measuring system can be easily structured.
Also, due to low-cost cameras, beam monitoring system with multiple cameras can be structured with low-cost on Kokyo’s system.
Kokyo’s product | Conventional one | |
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Customization | ◎ | ✕ |
Sales in combination | 1. Software only 2. Software and camera 3. Software, camera and optical system |
Software and camera only |
CCD camera by third company | ◎ | ✕ |
M2 beam quality measuring function |
◎ (standard installation with software) |
✕ (separate purchase) |
Measurable minimum beam diameter |
2 μm – | 30 μm – |
Measurable maximum beam diameter |
– 200 mm | – 24 mm |
Measurable maximum power |
~ 600 W | ? |
Language | Same as language on PC (English description is shown if it is English PC. Japanese is shown if it is Japanese PC) |
English |
Reviews on our beam profilers
- Camera is inexpensive, so don’t worry about breaking it.
- Camera can be used as disposable.
- Easy to prepare.
- The software is intuitive and easy to use.
- Inexpensive.
- M2 beam quality measurement is included as a standard feature, which is very nice.
- The evaluation results showed that the software works as expected, so we have just ordered the software. (used the evaluation version before purchasing)
- Kokyo’s beam profiler has been installed into our device and we find it very useful.
- Just Irradiating large diameter laser light makes easy measurement.
- This is only product/device to be able to evaluate laser from LiDAR and we find it vey helpful
Sales performance of our beam profilers
- Osaka University
- Kyushu University
- Kyoto University
- Kyoto Institute of Technology
- Shinshu University
- Nagoya University
- University of Electro-Communications
- The University of Tokyo
- Tokyo Institute of Technology
- Sophia University
- The Graduate University for the Creation of New Photonics Industries
- Hiroshima University
- University of Fukui
- Yamagata University
- University of the Ryukyus
- Utsunomiya University
- Saga University
- Japan Coast Guard (JCG)
- RIKEN
- National Institute for Fusion Science
- National Institute for Materials Science
- Japan Synchrotron Radiation Research Institute
- National Institute of Laser Science and Technology
- National Institute of Advanced Industrial Science and Technology (AIST)
- Japan Atomic Energy Agency
- National Institute of Information and Communications Technology
- Japan Aerospace Exploration Agency
- Quantum Science and Technology Research Organization
- National Astronomical Observatory of Japan (NAOJ)
- Japan Coast Guard Headquarters
- Leibniz University Hannover
- LMU Munich
- University of Vienna
- Victoria University of Wellington
- Institute of Atomic and Molecular Sciences Academia Sinica
- University of Southampton(Britain)
- Helmholtz-Zentrum Dresden-Rossendorf (HZDR, Germany)
- Institute of Physics AS CR, v.v.i. (Czech Republic)
- Jet Propulsion Laboratory, NASA
- Manufacturer of optical systems for information equipment and industrial applications
- Manufacturer of optical product research and development
- Israeli defense equipment manufacturer
- Major electronics manufacturer
- Major manufacturing manufacturer
- Leading manufacturer of measuring instruments
- Leading manufacturer of electronic measuring instruments
- Manufacturer of optical products
- Taiwanese electronics manufacturer
- Korean general home appliance manufacturer
- Other domestic and foreign private companies
Samples of Beam profiler
「Introduction of the large diameter beam profiler (LaseView-LHB) for evaluation of laser scanners, various light sources」
「Introduction of Laseview-LHB」
「Usage example of Laseview-LHB」
「Selection of products」
Principle of Beam profiler
Measurement method of beam patter about fixed type of beam profiler
CCD camera type of Beam profiler
The CCD camera beam profiler method uses a two-dimensional optical sensor to measure the light intensity of the entire beam at once. The CCD camera beam profiler system uses a two-dimensional optical sensor to measure the light intensity of the entire beam at once, which is much more efficient than a scanning beam profiler. By analyzing the obtained data, we can It can also be used to measure beam diameter, beam profile, and M2.
For light detection, a semiconductor device called a CCD (charged coupled device) is used, which consists of a two-dimensional array of optical sensors. When light is irradiated on the CCD, the intensity distribution is recorded by each individual photodetector (pixel). The intensity information obtained is captured by a computer as digital data, and is then processed by software. The spatial resolution is determined by the size of the CCD pixels.
The spatial resolution is determined by the size of the CCD pixels. Since the size of a typical pixel is about 10 mm, the beam diameter that can be measured is 100 μm to several tens of μm. The measurement time can be accelerated by increasing the readout speed of the charge stored in the CCD. However, the actual observation is limited by the frame rate of the monitor (30-60 fps) and the data transfer speed from the CCD to the PC.
Since the wavelength that can be detected by a typical CCD is about 1.1 μm Therefore, it is not possible to directly measure the beam profile of semiconductor lasers with a wavelength of 1.3μm or 1.5μm, which are used for optical communications. For out-of-band wavelengths, image converters and pyroelectric image sensors that convert infrared light into visible light are used.
Appearance and composition of Beam profiler
Inquiry about our beam profilers
For better suggestion to your inquiry, please send us your conditions of use including below items:
- Wavelength:
- Power:
- Beam diameter:
- Pulse type or CW type:
- Repetition frequency and Pulse width (in case of Pulse type):
- Internet available (or unavailable) with PC:
- Application (Ex: Processing laser, laser for LiDAR etc):
- Frequency of use:
- License figure (Over 5 figures, some discount is possible)
Q & A about our beam profilers