Current LaseView 6 lineup

Large beam diameter
High beam power
100 mm × 100 mm, 100 W/cm2

What is the Beam Profiler with M2 platform software LaseView ?

LaseView is a laser beam profiler software which can be used with commercially available CCD cameras, offering high performances and multi-purpose possibilities. As it can be used with commercial CCD or CMOS cameras, it allows the customer to easily build a low-cost and practical beam measurement system.

Features

For more details, click LaseView specification or Analysis Function details.

LaseView6 screen

Fig: LaseView6 screen

Mcan be easily measured with standard methods.

LaseView-M2-screenFig: M2 measurement screen

Beam divergence angle is an important parameter for light propagation characteristics which can be easily measured with a standard method. Its measurement’s procedure is described [here] and leads to this screen :

LaseView6-divergence

The Beam pointing stability varies with time and is an important parameter for Laser Beam stability which can be easily measured with a standard method. Its measurement’s procedure is described [here] and leads to this screen :

LaseView6-Beam-pointing

 

Comparison between usual products and LaseView

By using commercially available CCD or CMOS cameras, it is possible to easily realize a low-cost and practical beam measurement system. Moreover LaseView is compliant with a lot of low-cost cameras, allowing to adapt the beam measurement system to your needs.

Conventional profiler LaseView6
Main sale method Camera + Software Software only
(Camera as Option A
Selectable 3rd-party camera
(starting from US$500〜)
2 beam quality measurement function
(supplement US$ 5,000〜)
◎*
(included)
Software price  $2,500〜
Price for one $5,000〜 $3,000〜
(Software $2,500 + CCD camera price)
Price for 4 $20,000〜  $4,500〜
(1 software+4 cameras)
Beam profiler
+M2 beam quality measurement function
$10,000〜
($5,000〜+$5,000〜)
$3,000〜
(Software $2,500 + CCD camera price)
Smallest Measurable beam diameter 30 μm ~ 2 μm ~
(with Option B
Biggest Measurable beam diameter  ~24 mm ~100 mm
(with LaseView-LHB)
Language English English and Japanese
Illustration conventional-product LaseView

*Converging lenses with focal distances of 50mm-100mm (for instance with 1mm diameter beam) are recommended.
*As LaseView can be used with low-cost, easily replaceable cameras, user doesn’t have to be too much worried about breaking the camera for instance in harsh environment or training, and can even consider cameras as expandable materials. Our customers have reported a real easy-to-set up, easy-to-use feeling.

Examples of use of LaseView

Sample images

image examples

Fig: Near-field pattern of He-Ne laser, Far-field pattern of Ti:Sapphire laser (focalized by a F=3.3 parabolic mirror), Focused beam pattern from multi-mode fiber of laser diode

 

Beam monitoring in laser processing (1 software + 2 cameras)

Laser processing consists, after transferring the state of a parallel laser beam, in focusing it on a target object to irradiate it. If the beam direction or position in front of the lens changes, the focus point changes too and the beam profile as well, so that the object cannot be precisely processed. In order to maintain precisely the direction (Poynting vector) and the position of the beam in the center of the lens, an optical setup with 2 beam profilers is used. The parallel beam position (for example the beam barycenter) is measured at 2 places, and the beam is made to go through the expected position thanks to 2 active mirrors so that it can deliver a precise optical axis.

beam proflier kokyo01

Fig: Beam position monitoring in laser processing setup

 

Beam monitoring system in laser damage test (1 software + 4 cameras)

Laser processing tests (damage tests) address, when the sample position and the laser profile have been correctly measured, the need to check after irradiation the presence or absence of damage. Moreover, the reproducibility of the sample position after replacement, and for a large number of samples, is very important. For that purpose, an optical setup using several CCD is used.

(Note that as LaseView displays color images, color cameras can also be used for these observations).

beam profiler kokyo02

Fig: Beam monitoring using several CCD in a laser damage test setup

 

20160407_075721919_iOS20160407_075730932_iOSファイバー端面x20

 

Fiber optics measurement system

20160423_065741069_iOSファイバ端から出たビームの測定例

(Click to enlarge)

This is an example where a laser beam @975nm emitted from an FC/APC connector is measured using the micro-beam optical system. We see that the mode field diameter is about 6.4μm, which is consistent with the fiber specs (6.6 +/- 0.7μm @980nm). The measured intensity distribution (white) and its fitted Gaussian profile (red) are nearly identical, as the near-field pattern of the HE11 mode is described by a Bessel function, of which a Gaussian is a known good approximation.

Moreover, the aspect ratio of the beam slightly differs due to the polished angled surface of the connector. It can be seen that its horizontal direction became smaller by refraction at the fiber’s end.

  • Using LaseView with such a setup can show that the fiber output surface is not damaged.
  • It gives the fiber optics mode field diameter.
  • It shows that the Intensity distribution is Gaussian.
  • It indicates that the connector is an APC.

 

laseview_inquiry

LaseView lineup (detailed specifications, analysis functions, camera options, glossary)

* Camera will be needed in measuring beam profile and recommended ones are in the Cameras tab below.
* For high-power or small diameter beams please ask us the solutions we can provide.
* For large beam diameters, please check the page of LHB.
* If you don’t get any image when pushing the start button, please begin after defining “Pixel format” of the “Camera Setup” in the “Camera” tab.

Spec sheet

Features

  • Bar style User Interface (UI)
  • Image logging function
  • Analysis of beam pointing change over time
  • Analysis of the beam divergence angle
  • Histogram display
  • Measurement of the spatial intensity distribution of the beam
  • Measurement of the beam diameter
  • Measurement of M2
  • Measurement of micro-beams under 30 μm
  • Real-time image averaging features
  • Real-time contrast adjustment feature (wide dynamic range of 16bit / 65536 tone)
  • Image buffer function (able to sequentially display multiple images stored in memory)
  • TIFF format image storage function
  • Smooth display function by hardware acceleration
  • Support 32bit and 64bit Windows

Operating environment

Windows Vista SP1
Windows 7
Windows 8
Windows 8.1
Windows 10
CPU speed: similar or better than Intel Core i3 2GHz. Free memory: 512MB or more.
(This is not to guaranty operation on all computers fitting this description).
Installation of .NET Framework 4.5 or higher needed (you can check your current version on this Microsoft page: http://msdn.microsoft.com/ja-jp/library/hh925568(v=vs.110).aspx)

Depending on the version, the Guide illustrations may slightly differ from the actual screens but it can be used without any problem.

Analysis functions

  • Line Profile
    Line profile display on cross-lines (with Gauss, Lorentz and Sech functions fitting, and FWHM analysis function)
  • Integration Profile
    Displays averaged profile in the horizontal and vertical direction (with analysis functions similar to the Line profile)
  • Maximum Intensity Projection
    Displays in horizontal and vertical directions  of the orthogonal projection (maximum value) of the profile (with analysis functions similar to the Line profile)
  • Point-to-Point Distance
    Measurement of the distance between any two points on the screen
  • Peak Integration
    Analysis of the integrated value in a circle and analysis of the light intensity on the cursor setting the outside of the circle as a background

Example of analysis of line profile

Displays line profile on the white-cross line (in white). You can calculate FWHM of the beam profile, and also fit the profile with Gauss, Lorentz, and Sech functions.(The red line is the fitting result by Sech2 function). The white-cross line can be rotated.

lv5_lineprofileFig:  Example of analysis of line profile

Integration profile function

Displays averaged profile in the horizontal and vertical direction (with analysis functions similar to the Line profile).

LaseView6-Integration-profile

Maximum Intensity Projection function

Displays in horizontal and vertical directions of the orthogonal projection (maximum value) of the profile (with analysis functions similar to the Line profile). In this example, we measure the FWHM.

LaseView6-maximum-profile

Point-to-Point Distance function

Measurement of the distance between any two points on the screen. In the following example, we can see that the diameter at the green level is 826.8μm.LaseView6-Point2Point

Peak Integration function

Analysis of the integrated value in a circle and analysis of the light intensity on the cursor by setting the outside of the circle as a background.
Allows you to adjust the size of the circle which appears on the screen to fit yourself the laser beam. Then click on “Peak detection” to get the position indicated by a cross-line as below.

LaseView6-peak-integration

Recommended Cameras

CCD cameras

A camera is needed to use LaseView as a beam profiler.
* Camera with trigger are suitable for measurement of pulse laser
* Camera without cover glass are suitable for measurement of CW laser or nanosecond laser.
* CCD camera is sensible up to 1320nm but it will introduce errors in the beam profiler. Over 1100nm, it is recommended to use an Infrared camera to maintain a high accuracy.

CCD cameras with which LaseView has been verified are listed below. Among them, Imaging Source’s USB2.0 CCD Monochrome DMK 21AU04 is low cost and recommended.

Imaging Source Inc. USB 2.0 CCD monochrome camera

Format Resolution[pixel] Frame rate Sensor size Trigger cover glass  Indicative Price (excluding tax)
DMK 21AU04 640×480 60 fps 1/4“  US$570
DMK 21BU04 640×480 60 fps 1/4“  $720
DMK 31AU03 1024×768 30 fps 1/3“  $1,030
DMK 31BU03 1024×768 30 fps 1/3“  $1,150
DMK 41AU02 1280×960 15 fps 1/2“  $1,100
DMK 41BU02 1280×960 15 fps 1/2“  $1,150
DMK 51AU02 1600×1200 12 fps 1/1.8“  $1,520
DMK 51BU02 1600×1200 12 fps 1/1.8“  $1,640
DMK 51BU02.WG 1600×1200 12 fps 1/1.8“  $2,280
USB2.0 cable 2m  $1,000

Imaging Source Inc. USB 3.0 CCD monochrome camera

Format Resolution [pixel] Frame rate Sensor size Trigger Cover glass Indicative Price (excluding tax)
DMK 23U618 640×480 120 fps 1/4“  $590
DMK 23U445 1280×960 30 fps 1/3“  $690
DMK 23U274 1600×1200 20 fps 1/1.8“  $1,140
USB3.0 cable 2m  $3,000
  • 1. The actual display speed may be reduced due to performances and state of the PC
  • 2. with BNC connector
  • 3. with 12-pin connector
  • We cannot warranty the operation of above cameras on your specific devices
  • If a camera doesn’t work properly, it may be due to your PC or cable
  • We recommend using a USB cable (sold separately)
  • iDS and Basler cameras too have been operated with LaseView

CMOS Camera

CMOS cameras may be cheaper than CCD cameras.
Moreover, though CMOS has lower detection range, it is better than CCD on several points including response speed.

USB 3.0 CMOS Monochrome camera by IDS Imaging Development Systems GmbH

Format Resolution [pixel] Frame rate *1 Sensor size Indicative Price (excluding tax)
UI-3370CP-M-GL 2048 x 2048 80 fps 1“

USB 2.0 CMOS Monochrome camera by Thorlabs, Inc.

Format Resolution [pixel] Frame rate *1 Sensor size Indicative Price (excluding tax)
DCC1545M 1280 x 1024 25 fps 1/2“ $460
  • 1. The actual display speed may be reduced due to performances and state of the PC
  • Thorlabs cameras require iDS OEM drivers to operate; if you have installed Thorlabs drivers, uninstall them and then install iDS drivers instead (request them from iDS directly).
  • If a camera doesn’t work properly, it may be due to your PC or cable

 Infrared camera and driver set

Infrared camera will be needed for laser with wavelength over 1100 nm in order to maintain a high accuracy.
For the following infrared cameras an extension driver for LaseView is needed. For the extension driver only, price is $1,000 (excluding tax).

ARTCAM-008TNIR by ARTRAY Inc.

Interface: USB 2.0
Sensor:InGaAs, 9.6(H)x7.68(V)mm
Wavelength: 900-1700 nm
Frame rate: 90 fps

Details of the Analysis functions

1. M2 beam quality Analysis function

The procedure of the optical system setting is described below:

  1. The laser beam shall be focalized through a lens with f-number (focal length/beam diameter) between ~50 to ~100.
  2. Install a ruler or an optical rail along the beam so that the CCD camera can slide in a range of ±50mm~±150mm around the beam waist.
  3. In order to avoid a too much powerful laser beam, adjust the amount of incident light or the Gain / Exposure time.

Fig 9Fig.9 Schematics of measuring M2.

2 beam quality measurement procedure is described below:

  1. Click on the “Open folder” of the “File” tab, and create an empty folder (or indicate an existing one) in order to save the images.
  2. Along the laser beam, take and save 10~30 measurements of beam profile over the range of ±50mm~±150mm around the beam waist. Proceed as follow:
    1. Check the diameter to find where the beam waist is.
    2. Move the camera at a location where the diameter is 5 times the waist diameter.
    3. Lock the position and adjust the amount of incident light or the Gain / Exposure time so that noise is minimized and images are of good quality.
    4. Click “Save the image” of the “File” tab; in the text box of the file name, enter the current position of the CCD in Arabic number (half width), and save. In the text box, it is possible to write the unit of distance after the number ; nm, μm(um)、mm、cm、m (all half width) can be used, if you don’t indicate unit, it will be considered as mm. Examples: 30mm.tif, 100mm.tif, 150mm.tif…
    5. Move the camera in steps of 2~10mm. Repeat 2.3 to 2.5 ; it is not necessary to move by equal steps, but if you take narrower steps in the vicinity of the waist, you may improve the final accuracy.
  3. Finally, click on the “Collective analysis” of the “M2 beam quality” tab. M2 beam quality analysis window opens ; enter the laser wavelength in the upper-right corner text box.
  4. Run the analysis by clicking the “Execute analysis” button; if successful the results are displayed in the graph.

※ Analysis result indicates the beam radius.

LaseView-M2-screenFig: M2 measurement screen

2. Divergence angle Analysis function

Beam divergence angle measurement procedure is described below:

  1. Click on “Open Folder” of the “File” tab, and create an empty folder (or indicate an existing one) in order to save the images.
  2. Measurements taken at 2 or more positions shall be saved in the same folder. Indicate the position in the file name (example: 1.5m, 25cm…).
  3. Click the “Divergence angle” button of “Collective analysis” tab . The Divergence angle window opens.
  4. When you click the “Execute analysis”, the result will be displayed in a graph.

LaseView6-divergence

3. Beam pointing variation Analysis function

Beam pointing measurement procedure is described below.

  1. Click on “Open Folder” of the “File” tab, and create an empty folder (or indicate an existing one) in order to save the images.
  2. Use the image logging function, and save images taken at an appropriate time interval.
  3. Click the “Pointing” button.
  4. When you click the “Execute analysis”, the changes over time of X and Y coordinates of the beam barycenter will be displayed in a graph. The elapsed time time is calculated based on the shooting date and time embedded in the file.

LaseView6-Beam-pointing

About beam profiler

1.1. Camera

1.2. Beam Profiler

1.2.1. What is Beam Profiler

A Beam profiler is a device to measure the beam diameter and the spatial intensity distribution of a laser. Beam diameter and the spatial intensity distribution are the laser characteristics that represent how the laser behaves. For example, even if the two lasers have the same intensity and beam diameter, if the spatial intensity distribution is deferent, the two lasers do not behave the same. Also even with a strictly designed laser resonator, difficult to accurately predict the beam characteristics that can actually be obtained is difficult, dew to manufacturing errors of the optical element and surrounding environment such as temperature. So it is important to actually measure, the properties of the beam.

A beam profiler is used for measuring beam characteristics. There are two main measuring types, fixed type beam profiler and scanning type beam profiler (table 1). Using fixed type beam profiler, it is possible to efficiently measure the beam pattern, because it measures the entire beam at once using a two-dimensional optical sensor. Also it is possible to measure pulse wave and continuous wave. Scanning type beam profiler, uses a single optical detector to measure the light intensity of that moment. Scanning type is a more low cost system than the fixed type. Both methods can measure N.F.P. (near field patter) and F.F.P. (far field pattern) of the beam.

Here we will explain the definition of the beam diameter, then each of the methods of measuring beam profile.

Table Beam characteristic measurement methods
(Advantages and disadvantages of fixed type beam profiler and scanning type beam profiler)

Merit Demerit
Fixed type beam profiler
・CCD camera type beam profiler
・Short measuring time
・Can measure pulse light
・Possible to identify complex beam patterns
(such as donut-shaped pr flat-top)
・For small beam diameters need extra optical device
Scanning types beam profiler
・Slit type
・Knife edge type
・Measurement of small beam diameter is easy ・Long measuring time
・Difficult to measure pulse wave
・Identifying complex beam pattern is difficult

1.2.2. Definition of Beam Diameter

Laser beam has a distribution of light intensity in the plane that is perpendicular to the direction of propagation. Light does not have a clear border, so we need to define beam diameter. They are several defining methods, however the most commonly used is the following. In a Gaussian beam, which the intensity distribution is circular symmetry, position of the beam diameter is where the light intensity becomes 1/e2 of the maximum intensity.
The intensity of a Gaussian beam with a light intensity of P, is represented in the following equation.
1

Figure 1(a) shows the cross section and the intensity profile of the Gaussian beam mentioned in Eq. (1).
The beam diameter is w0. There are also other methods. Such as the method that defines the beam diameter as, where the intensity becomes half of the maximum intensity. This is called full-width half-maximum, FWHM.

The definitions above cannot be easily applied to a laser that has an asymmetric beam shape. With asymmetric beams, the range which has 86.5% of the light intensity is defined as the beam diameter (Fig. 1(b)). With a beam with highly complex form, and is difficult to define the beam diameter, ISO Standard is used. In ISO Standard the beam diameter is defined as, the level where the value of the second moment of the intensity distribution becomes 1/e2.

Fig.1Definition of beam diameter. (a) Gaussian beam (b) beam with a complex formFig.1Definition of beam diameter. (a) Gaussian beam (b) beam with a complex form.png

1.2.3. CCD Camera Type Beam Profiler

This system measures the light intensity of the whole beam at once, using two-dimensional optical sensors. Because of this, it is more efficient than scanning type beam profiler.
By analyzing the data it is possible to measure beam diameter, beam profile and M2[1].

For light detection, CCD (charged coupled device), which is a semiconductor device with optical detectors arranged two-dimensionally, is used. When light is irradiated to the CCD, the intensity distribution is recorded by each optical detector. The obtained information is fed in to a computer, and reconstructed as a two-dimensional or three-dimensional intensity distribution image, using a software (Fig. 2).

Spatial resolution is determined by the size of the pixels of the CCD. The size of a general pixel is approximately 10 μm, the diameter of a measurable beam is between a few dozen μm and 100 μm. Measurement time can be speeded up by increasing the speed of discharge and charge of electrons that is stored in the CCD. However in actual monitoring, it is limited to the monitors frame rate (30 fps).

Wavelength that a normal CCD can detect is about 1.1 μm. Because of this, it is not possible to directly detect the beam profile of laser diode radiation used for optical communication that uses 1.3 μm and 1.5 μm. For wavelengths outside the band an image converter that converts infrared light to visible light is used.

Fig. 2 Fixed type beam profilerFig. 2 Fixed type beam profiler

1.2.4 Pinhole Type Beam Profiler

It can get the intensity distribution of the entire beam by scanning the pinhole two-dimensionally along the plane perpendicular to the optical axis of the laser beam while measuring the transmitted laser beam intensity (Fig. 3). Making the diameter of the pinhole smaller can increase the spatial resolution. Normally, a pinhole the one hundredth of the beam diameter’s size is used. Because it is possible to measure the intensity distribution of any shape, it is possible to measure a complex beam pattern. It is used to measure the continuous wave with no time variation.

Fig.3 Pinhole-scanning type beam profilerFig.3 Pinhole-scanning type beam profiler

1.2.5 Slit Type Beam Profiler

The same as pinhole type, by scanning the rectangular slit two-dimensionally along the plane perpendicular to the optical axis of the laser beam, the spatial intensity distribution can be measured(Fig. 4). One-dimensional intensity distribution along the scan direction can be obtained. To get a multidimensional intensity distribution, it is necessary to scan from several directions. It is suitable for measuring a beam with an axisymmetric intensity distribution. Narrowing the slit width increases the spatial resolution. It has a high resolution, and can measure a beam diameter down to about 20 μm.

Fig. 4 Slit-scanning type beam profilerFig. 4 Slit-scanning type beam profiler

1.2.6 Knife-edge Type Beam Profiler

This method uses a blade as an obstacle.
Place the knife at the plane perpendicular to the optical axis of the laser beam, and measure the intensity of the light that passes through (Fig. 5). It measures the intensity diameter distribution by moving the knife along the plane. Unlike the slit type beam profiler, by moving the knife, it changes the light intensity (Fig. 5(b)). At this time, between the one-dimensional spatial intensity distribution i(x) and the measured light intensity i ‘ (x), the following relationship can be established.

2

Therefor, the spatial intensity distribution can be obtained by simply dividing the measured light intensity by the knife’s axial displacement. The spatial resolution is better than slit type beam profiler, it can measure a beam diameter down to about 10 μm.

Fig. 5 (a) Knife edge type beam profilerFig. 5 (a) Knife edge type beam profiler
(b) Relation between measured intensity and intensity distribution

1.2.7. Measuring N.F.P. and F.F.P.

In order to know the characteristics of the beam of an optical device such as, laser diodes or optic fibers, it is necessary to measure the following two profiles. The beam profile near the exit end (N.F.P.: near field pattern), and the beam profile far away from the exit end (F.F.P.: far field pattern). Here we will explain how to measure them with a fixed type beam profiler (CCD type).

For the spatial intensity distribution of a micro level (N.F.P.), magnifying optical system such as a microscope (Fig. 6) is used. The exit end is magnified with an objective lens and then focused on the CCD by a relay lens. Since it is a very small beam, accurate focusing is required. This can be easily achieved by, splitting the beam in two using a beam splitter, and feeding one of them in to the monitoring CCD, thus setting the focus position while observing with a wider field of view.

By measuring F.F.P., diffusion angle of laser diode radiation and N.A. of optic fibers can be measured.
To measure F.F.P., an optical system that uses a f-θ lens, which converts the incident angle to the focal position is used (Fig. 7).

Fig. 6 OpticalFig. 6 Optical system for measuring N.F.P.

Fig.7 OpticalFig. 7 Optical system for measuring F.F.P.

1.2.8. What is M2 Beam Quality Measurer?

A M2 beam quality measuring instrument is an instrument that measures laser’s beam quality. Even with a lasers resonator that has the same performance, characteristics of the focused laser beam varies depending on the injection output beam’s characteristics condensing characteristics change.
This is an important parameter, in a field that constant quality is required, such as laser processing. As a measurement of beam quality, the focusing characteristics of a beam, is defined as M2, K value and B.P.P. (beam parameter product).

When condensing focusing laser light with lends, the theoretical minimum spot size is determined by the diffraction limit.
However, if the beams intensity profile is disarranged, the beam cannot be focused the beam to the diffraction limit. M2 is an index to show how many times bigger the beam diameter is to the diffraction limit. If M2 is 1, that beam will have a theoretically minimum focus point. K value is the reciprocal number of M2. B.P.P also has the same meaning as M2, and is shown in the product of the beam divergence angle and the beam waist radius. B.P.P. is mostly used to represent the beam quality of a semiconductor laser diode.

1.2.9. Definition of M2

Even with laser beams that have a strong directivity, and seem to be propagating in a straight line, the beam diameter spreads with propagation. The situation near the beam waist of a propagating beam is shown in Fig. 8.
Near the beam waist, the beam radius in the x-axis and y-axis directions wx,y (z) can be given by the following equation[1].

3

w0x,0y, z0x,0y, and θ0x,0y shows the beam waist radius at the x-and y-axis directions, the position of the beam waist, and the divergence angle of the beam, respectively. The Mx、y2 here is used as a parameter to determine the beam quality, and has the following properties.

  • M2 is always above 1.
  • žWhen M2≡1, the beam is a single-mode Gaussian beam.
  • M2 shows how many times bigger the beam diameter is to the diffraction limit.

M2 is defined using laser beam parameters as the following.

4

λ indicates the wavelength of the laser light.

8

Fig. 8 The state of the vicinity of the beam waist of a Gaussian beam that is centrally symmetric.

1.2.10. Measuring Method of M2

As shown in Eq. (4), M2 can be evaluated by measuring the beam waist radius w0 and the divergence angle of the beam θ0. These parameters can be obtained by, focusing the beam and measure measuring beam diameters of several points along the optical axis (Fig. 9). To reduce the error, measuring at many points as possible, especially around the beam waist should be performed. This increases the accuracy of determining the beam waist.
M2 of major laser beams are summarized in Table 2.

Fig 9Fig.9 Schematics of measuring M2.

Table 2 Quality of major laser beams

Light source M2
He-Ne laser < 1.1
Ion laser 1.1 ~ 1.3
Semiconductor laser
(Collimated light,TEM00)
1.1 ~ 1.7
High-power multimode laser 3 ~ 4

LaseView Purchasers

Osaka University
National Institute for Fusion Science
Kyoto University
The University of Electro-Communications
Tokyo Institute of Technology
Japan Atomic Energy Agency
Hiroshima University
Fukui University
RIKEN
Helmholtz-Zentrum Dresden-Rossendorf (HZDR)
Institute of Physics AS CR, v.v.i.
Jet Propulsion Laboratory, NASA
Other companies

Users feedback

  • “As cameras are cheap, we are not worrying breaking them”
  • “We can use cameras as expandable goods”
  • “Easy to prepare”
  • “The Software is easy to use and intuitive”
  • “Low-cost !”
  • “It is great to have M2 beam quality measurement function already included”

LaseView’s price

Product name and number Price Delivery time Catalog Manual
Beam profiler withM2 platform software – LaseView 6 US$2,500 Within the day (download) PDF PDF
LaseView 6  “7 days trial” US$ 0 Within the day (download) PDF PDF

* Latest version is 6.0.2.0

* Purchasers of LaseView 5 version, please contact us for a free upgrade !

Reference Websites

Measuring Instrument Selection page for above beam profiler (English)
Former version LaseView 5 page (English)
Beam profiler for large diameter and high output (English)

laseview_button  paypal accepted here